AVS 52nd International Symposium | |
MEMS and NEMS | Monday Sessions |
Session MN-MoM |
Session: | Processing & Characterization of Materials for MEMS & NEMS |
Presenter: | W.-C. Tian, GE Global Research Center |
Authors: | A. Zribi, GE Global Research Center W.-C. Tian, GE Global Research Center A. Knobloch, GE Global Research Center |
Correspondent: | Click to Email |