| AVS 52nd International Symposium | |
| MEMS and NEMS | Monday Sessions |
| Session MN-MoM |
| Session: | Processing & Characterization of Materials for MEMS & NEMS |
| Presenter: | W.-C. Tian, GE Global Research Center |
| Authors: | A. Zribi, GE Global Research Center W.-C. Tian, GE Global Research Center A. Knobloch, GE Global Research Center |
| Correspondent: | Click to Email |