| AVS 52nd International Symposium | |
| Applied Surface Science | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS-WeM1 TOF-SIMS: Accurate Mass Scale Calibration F.M. Green, I.S. Gilmore, M.P. Seah, National Physical Laboratory, UK |
| 8:40am | AS-WeM2 Quantitative XPS: Quadrupole Terms, Shake-Up, Shirley Background and Relative Sensitivity Factors M.P. Seah, I.S. Gilmore, National Physical Laboratory, UK |
| 9:00am | AS-WeM3 Invited Paper SURFACE SCIENCE SPECTRA: The AVS Surface Science Database for the Surface Spectroscopy Community S.W. Gaarenstroom, General Motors R&D Center |
| 9:40am | AS-WeM5 Software Package to Determine @epsilon@(k,@omega@) from Analysis of REELS S. Tougaard, University of Southern Denmark, F. Yubero, Inst. de Ciencia de Materiales de Sevilla, Spain |
| 10:00am | AS-WeM6 Complete Analysis of ToF-SIMS Spectral Images in a Research and Development Analytical Laboratory V. Smentkowski, General Electric Global Research Center, M. Keenan, J.A. Ohlhausen, P.G. Kotula, Sandia National Laboratories |
| 10:20am | AS-WeM7 Invited Paper Principal Components Analysis of TOF-SIMS Data: Why, What, and How D.J. Graham, University of Washington |
| 11:00am | AS-WeM9 Automated Peak Identification in a TOF-SIMS Spectrum H. Chen, E.R. Tracy, W.E. Cooke, M.W. Trosset, College of William and Mary, D. Malyarenko, INCOGEN Inc., D.M. Manos, College of William and Mary, M. Sasinowski, INCOGEN Inc. |
| 11:20am | AS-WeM10 More Information from Shorter Acquisition Times in XPS Imaging and Other Multivariate Surface Analytical Datasets P.J. Cumpson, National Physical Laboratory, UK |
| 11:40am | AS-WeM11 Improvements in the Spatial and Spectral Resolution of X-ray Photoelectron Images through Multivariate Analysis and Multisensor Fusion K. Artyushkova, J.E. Fulghum, L.R. Williams, The University of New Mexico, S.J. Hutton, S.J. Coultas, Kratos Analytical Ltd., UK |