AVS 52nd International Symposium
    Nanometer-Scale Science and Technology Tuesday Sessions
       Session NS-TuP

Paper NS-TuP40
Morphological, Nanomechanical and Cellular Structural Characterization of Human Hair and Conditioner Distribution Using Torsional Resonance Mode with an AFM

Tuesday, November 1, 2005, 4:00 pm, Room Exhibit Hall C&D

Session: Nanometer Scale Science and Technology Poster Session
Presenter: N. Chen, The Ohio State University
Authors: B. Bhushan, The Ohio State University
N. Chen, The Ohio State University
Correspondent: Click to Email
Characterization of cellular structure and chemical and physical properties of hair are essential to develop better cosmetic products and advance the biological and cosmetic science. Although the morphology of the fine cellular structure of human hair has traditionally been investigated using scanning electron microscopy (SEM) and transmission electron microscopy (TEM), atomic force microscopy (AFM) can be used for characterization in ambient conditions without requiring specific sample preparations and surface treatment. In this study, tapping mode (TM) and torsional resonance (TR) mode in an AFM are compared for measurements of stiffness and viscoelastic properties mapping of the materials using amplitude and phase angle imaging. The TR mode shows advantages in resolving in-plane (lateral) heterogeneity of materials. The TR mode has been used for investigating and characterizing fine cellular structure of human hair. Various cellular structure (such as the cortex and the cuticle) of human hair and fine sublamellar structures of the cuticle, such as the A-layer, the exocuticle, the endocuticle, and the cell membrane complex could be easily identified. The distribution and thickness of conditioner on treated hair surface affects tribological properties of hair. The conditioner thickness has been estimated using force distance measurements with an AFM.