AVS 52nd International Symposium
    Nanometer-Scale Science and Technology Tuesday Sessions
       Session NS-TuP

Paper NS-TuP28
Electrical Characteristics of DNA-Nanoparticle Networks using Scanning Probe Microscopy

Tuesday, November 1, 2005, 4:00 pm, Room Exhibit Hall C&D

Session: Nanometer Scale Science and Technology Poster Session
Presenter: N.J. Lee, Myongji University, Japan
Authors: N.J. Lee, Myongji University, Japan
Y.J. Kim, Myongji University, Japan
J.S. Kim, Myongji University, Japan
B.H. Nahm, Myongji University, Japan
D. Jeon, Seoul National University, Korea
Y.S. Kim, Myongji University, Korea
C.J. Kang, Myongji University, Korea
Correspondent: Click to Email
Transport properties of the DNA-nanoparticle networks constructed by the self-assembly of biotinylated DNAs and streptavidins are studied by scanning probe microscopy (SPM). First, we measured I-V characteristics of DNA network linked between two metal electrodes deposited on mica surface, and these results were classified with respect to the conformational change of DNA molecules. Next, SPM probe tip was used as a counter electrode for the fixed metal electrode. In this experiment, only one end of DNA molecule was attached to the fixed electrode and the tip was scanned over DNA molecules to measure the local property. We also monitored capacitance or potential difference within the networks with SPM while biasing the network. To find out the charging effect in the network, we directly injected charge into the DNA molecule through SPM tip and performed microscopy and spectroscopy. In this talk, local electrical properties of the DNA-nanoparticle networks observed by SPM and their possibility to be applied for nano devices will be presented.