AVS 52nd International Symposium
    Electronic Materials and Processing Tuesday Sessions
       Session EM-TuP

Paper EM-TuP17
Optical and Interfacial Electronic Properties of Spin Cast Poly(o-methoxyaniline) (POMA)Thin Films

Tuesday, November 1, 2005, 4:00 pm, Room Exhibit Hall C&D

Session: Electronic Materials and Processing Poster Session
Presenter: R.P. Shrestha, University of North Carolina-Chapel Hill
Authors: R.P. Shrestha, University of North Carolina-Chapel Hill
D.X. Yang, University of North Carolina-Chapel Hill
E.A. Irene, University of North Carolina-Chapel Hill
Correspondent: Click to Email
Optical properties of semiconducting polymer, Poly(o-methoxyaniline)(POMA) thin films prepared by spin casting have been studied and using optical transmission spectroscopy and spectroscopic ellipsometry in the visible-near uv optical range. The dispersion in refractive index and extinction coefficient along with anisotropy, surface roughness and annealing results are reported.@footnote 1@ Small uniaxial anisotropy has been measured and annealing leads to some densification and surface smoothing. Capacitance versus voltage (C-V)and current versus voltage (I-V) measurements were performed on capacitor and thin film transistor (TFT) structures, respectively. The C-V results indicate to yield a value of about 5 for the static dielectric constant. The I-V yields TFT transfer characteristics are used to optimize the film formation process and the performance of thin film POMA as a P-type semiconductor for TFT's. @FootnoteText@ @footnote 1@R.P. Shrestha, D. Yang, and E.A. Irene, Ellipsometric determination of the Optical Properties of Poly(o-methoxyaniline), Thin Solid Films, submitted Feb 2005.