AVS 52nd International Symposium
    Electronic Materials and Processing Wednesday Sessions
       Session EM+SS-WeM

Invited Paper EM+SS-WeM3
Interface Disorder and Charge Injection into Organic Semiconductors

Wednesday, November 2, 2005, 9:00 am, Room 309

Session: Contacts to Organic and Molecular Devices
Presenter: M.A. Baldo, MIT
Authors: M.A. Baldo, MIT
B.N. Limketkai, MIT
Correspondent: Click to Email
In this talk, we examine the effect of structural disorder at the injection interface on the current-voltage (IV) characteristics of organic semiconductors. We find that structural disorder at the injection interface creates energetic disorder, which in turn may dominate the IV characteristics of these materials. We will describe the effects of interfacial disorder on charge injection in several model systems: flat metal electrodes, rough metal electrodes, and highly conductive polymer electrodes. Disorder is most important at interfaces with relatively small energetic barriers between the metal and semiconductor.