AVS 52nd International Symposium | |
Applied Surface Science | Thursday Sessions |
Session AS+TF-ThM |
Session: | Thin Film Characterization |
Presenter: | K. Prabakar, Toyama University, Japan |
Authors: | K. Prabakar, Toyama University, Japan T. Takahashi, Toyama University, Japan T. Nakashima, Kashiwa Chuo High School, Japan Y. Kubota, Yokohama City University, Japan A. Fujishima, Kanagawa Academy of Science and Technology, Japan |
Correspondent: | Click to Email |