AVS 51st International Symposium
    Semiconductors Tuesday Sessions
       Session SC-TuP

Paper SC-TuP4
Fabrication and Properties of Thin Film Photon Sieve Diffractive Lens

Tuesday, November 16, 2004, 4:00 pm, Room Exhibit Hall B

Session: Poster Session
Presenter: N. Bradman, University of Florida
Authors: N. Bradman, University of Florida
H. Chung, University of Florida
M. Davidson, University of Florida
P.H. Holloway, University of Florida
K. Woo, University of Florida
D. Tanner, University of Florida
S. Selcuk, University of Florida
A. Hebard, University of Florida
O. Shenderova, International Technology Center
A. Shenderova, International Technology Center
G.E. McGuire, International Technology Center
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Photon sieves are diffractive lens that offer better focusing than Fresnel zone plates and are lighter weight and lower volume than refractive lens. The photon sieve lens in this study consists of a transparent substrate coated with an opaque metal thin film with a pattern of holes in a circular array. The size of the holes range from above to below the wavelength of light being focused. Fabrication of the photon sieve lens will be described, which consists of a thin electron beam metallization, pattern writing by electron beam lithography, and pattern development by reactive ion etching. In addition to significant reductions in weight and volume, photon sieves offer a larger field of view than refractive optics, but they suffer from poor transmission. Surface plasmon resonant coupling will be reported to improve the transmission by factors of two to five at the resonant wavelength. The coupling of the surface plasmon resonant structure with the photon sieve pattern will be discussed. Transmission data for traditional and modified photon sieves will be presented and compared.