AVS 50th International Symposium
    Plasma Science and Technology Thursday Sessions

Session PS-ThA
Plasma Diagnostics: Mechanisms

Thursday, November 6, 2003, 2:00 pm, Room 315
Moderator: N.C.M. Fuller, IBM TJ Watson Research Center


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Click a paper to see the details. Presenters are shown in bold type.

2:00pm PS-ThA1
In-Situ Monitoring of Unstable Neutral Molecules using Ion Attachment Mass Spectrometer
Y. Shiokawa, M. Nakamura, Y. Hirano, Y. Taneda, T. Fujii, Anelva Corporation, Japan
2:20pm PS-ThA2
Discharge Frequency Dependence of Plasma Parameters in Parallel-plate-electrode VHF Plasmas
Y. Ichikawa, Fuji Electric Co. Ltd., Japan, T. Sasaki, Fuji Electric CRD, Japan, S. Matsumura, Musashi Institute of Technology, Japan
2:40pm PS-ThA3 Invited Paper
Model-based RF Plasma Monitoring under Industrial Conditions
M. Klick, ASI Advanced Semiconductor Instruments, Germany
3:20pm PS-ThA5
Study of Pulsed Plasma Doping System by Time-resolved Ion Mass-energy Spectrometry
L. Godet, B.-W. Koo, VSEA, France, G. Cartry, C. Cardinaud, Institut des Materiaux de Nantes, France, Z. Fang, VSEA, France, A. Grouillet, D. Lenoble, STMicroelectronics, France
3:40pm PS-ThA6
Gas-Phase Diagnostics and Mechanisms of Energy Transfer in O@sub 2@/NH@sub 3@ Plasmas
K.R. Kull, D.S. Wavhal, E.R. Fisher, Colorado State University
4:00pm PS-ThA7
The Study of Ion Drift Velocities and Instabilities in Presheaths in Two Ion Species Plasmas
X Wang, E. Ko, N. Hershkowitz, University of Wisconsin, Madison
4:20pm PS-ThA8
Ion Collection by a Mach Probe in Flowing Unmagnetized Plasma
E. Ko, X Wang, N. Hershkowitz, University of Wisconsin, Madison
4:40pm PS-ThA9
Novel Plasma Monitoring Scheme by Surface Wave Probe
H. Sugai, H. Kawai, Nagoya University, Japan, K. Nakamura, Chubu University, Japan
5:00pm PS-ThA10
Measurement of Absolute Radical and Metastable Species Densities in O@sub 2@ and N@sub 2@ Plasmas using Modulated Beam Appearance Ionization Mass Spectrometry
S. Agarwal, University of California, Santa Barbara, G.W.W. Quax, B. Hoex, M.C.M. van de Sanden, Eindhoven University of Technology, The Netherlands, D. Madoudas, University of Massachusetts, Amherst, E.S. Aydil, University of California, Santa Barbara