AVS 50th International Symposium | |
Applied Surface Science | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
2:00pm | AS+BI-TuA1 Spatially Defined Immobilization of Biomolecules on Microstructured Polymer Substrate* A. Hozumi, N. Shirahata, National Institute of Advanced Industrial Science and Technology, Japan, S. Asakura, A. Fuwa, Waseda University, Japan, Y. Yokogawa, T. Kameyama, National Institute of Advanced Industrial Science and Technology, Japan |
2:40pm | AS+BI-TuA3 Low-Temperature STM Manipulation of Single Bio Molecules J.J. Benson, V. Iancu, A. Deshpande, S.-W. Hla, Ohio University, Athens |
3:00pm | AS+BI-TuA4 Base-dependent Displacement of Thiolated DNA Films by Mercaptohexanol (MCH) H. Kimura-Suda, National Institute of Standards and Technology, D.Y. Petrovykh, University of Maryland & Naval Research Laboratory, L.J. Whitman, Naval Research Laboratory, M. Tarlov, National Institute of Standards and Technology |
3:20pm | AS+BI-TuA5 Invited Paper Neuron Pathfinding and Surface Chemistry, Patterning and Reactions T.P. Beebe, Jr., University of Delaware |
4:00pm | AS+BI-TuA7 In-situ Spectroscopic Study of Thermal Phase Transition of Supported Hybrid Bilayer Membranes C.S.-C. Yang, K.A. Briggman, J.C. Stephenson, L.J. Richter, National Institute of Standards and Technology |
4:20pm | AS+BI-TuA8 Spectroscopic Quantification of Covalently Immobilized Oligonucleotides A.V. Saprigin, C.W. Thomas, C.H. Patterson, M.S. Spector, Naval Research Laboratory |
4:40pm | AS+BI-TuA9 Photoionization for Trace Measurement of DNA on Surfaces J.F. Moore, W.F. Calaway, Argonne National Laboratory, B.V. King, University of Newcastle, Australia, J.W. Lewellen, S.V. Milton, M.J. Pellin, Argonne National Laboratory, M. Petravic, Australian National University, I.V. Veryovkin, Argonne National Laboratory, G.L. Woloschak, Northwestern University |
5:00pm | AS+BI-TuA10 Utilization of Polyatomic Primary Ion Sources for Analysis of Drug Delivery Systems by Secondary Ion Mass Spectrometry (SIMS) C.M. Mahoney, G. Gillen, National Institute of Standards and Technology |