A perspective will be given on the development and use of surface analysis, primarily by AES and XPS, for solving scientific and technological problems. Some of the early approaches for AES and XPS analyses will be described together with major developments (e.g., the availability of demountable flanges and suitable pressure gauges) in instrumental capabilities. Information will be presented on growth and trends in instrumental measurements with reduced uncertainties, knowledge of surface sensitivity, and knowledge and effects of sample morphology. Finally, an overview will be given of analytical resources now available for AES, XPS, and SIMS.