AVS 50th International Symposium
    Applied Surface Science Monday Sessions
       Session AS-MoM

Paper AS-MoM4
Quantitative Depth Distribution Analysis of Hg and Na in Glass

Monday, November 3, 2003, 9:20 am, Room 324/325

Session: Practical Surface Science
Presenter: T.A. Dang, Osram Sylvania
Authors: T.A. Dang, Osram Sylvania
T.A. Frisk, Osram Sylvania
M.W. Grossman, Osram Sylvania
C.H. Peters, Osram Sylvania
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Fluorescent lamps use mercury for efficient conversion of electrical power to light. During lamp operation, some Hg is consumed through interaction and/or deposition on lamp components. One of the primary sites for interaction is the soda lime glass used as a lamp tube. The association of Hg and Na from the glass has been observed by XPS mapping.@footnote 1@ It is of particular interest to also evaluate the relationship of these two elements in deeper layers. A depth distribution analysis of Hg and Na would readily provide such information. It has always been a challenge to obtain the depth distribution of Na in glass using sputtering techniques. Due to the high mobility of Na, a soft sputtering condition, which minimizes Na diffusion, is generally required. Unfortunately, this also decreases the sensitivity for Hg, whose intensity is several orders of magnitude lower than that of Na. Simultaneous measurement of Na and Hg is strongly desirable because of the non-uniform nature of the interaction. In this presentation, we are going to compare the depth distribution analysis of Na and Hg using Secondary Ion Mass Spectrometry (SIMS) and High-Frequency Square-Wave Sputtered Neutral Mass Spectrometry (HFSW-SNMS). The advantages and disadvantages of each technique will be discussed. Samples included in the evaluation are composed of both quartz and soda lime glass wafers implanted with Na and Hg respectively as well as the real soda lime glass lamp tube subjected to normal lamp operation. @FootnoteText@ @footnote 1@ T. A. Dang, T. A. Frisk and M. G. Grossman, Anal. Bioanal. Chem., 373, 560 (2002).