| AVS 49th International Symposium | |
| Electronic Materials and Devices | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | EL+SC-TuA1 Active-Device Scanning Voltage Microscopy Studies on a Forward and Reverse Biased InP pn Junction Sample ST.J. Dixon-Warren, R. Dworschak, G. Este, AJ. SpringThorpe, J.K. White, Nortel Networks, Canada, D. Ban, E.H. Sargent, University of Toronto, Canada |
| 2:20pm | EL+SC-TuA2 Scanning Tunneling Microscopy Imaging of Charged Defects on Clean Si(100)-(2x1) G.W. Brown, H. Grube, M.E. Hawley, Los Alamos National Laboratory, S.R. Schofield, N.J. Curson, M.Y. Simmons, R.G. Clark, University of New South Wales, Australia |
| 2:40pm | EL+SC-TuA3 Invited Paper The Surface Photovoltage and Photoelectron Spectroscopy J.P. Long, Naval Research Laboratory |
| 3:20pm | EL+SC-TuA5 Direct Measurement of the Electrical Potentials in GaInP@sub 2@ Solar Cells C.-S. Jiang, H.R. Moutinho, J.F. Geisz, D.J. Friedman, M.M. Al-Jassim, National Renewable Energy Laboratory |
| 3:40pm | EL+SC-TuA6 Deep Level Defect Characterization of InGaAsN Layers Grown by Molecular-Beam Epitaxy S.W. Johnston, R.K. Ahrenkiel, A.J. Ptak, National Renewable Energy Laboratory |
| 4:20pm | EL+SC-TuA8 Thermal Quenching and High Temperature Cathodoluminescent Degradation of Sulfide-Based Powder Phosphors B.L. Abrams, L.C. Williams, J.-S. Bang, P.H. Holloway, University of Florida |
| 4:40pm | EL+SC-TuA9 Analysis of Ion Implantation Damage in Silicon Wafers by a Contactless Microwave Diagnostic R.K. Ahrenkiel, National Renewable Energy Laboratory, B. Lojek, Atmel Corporation |
| 5:00pm | EL+SC-TuA10 Gas-phase Nanoparticle Formation during AlGaN MOCVD J.R. Creighton, W.G. Breiland, M.E. Coltrin, Sandia National Laboratories |