| AVS 49th International Symposium | |
| Applied Surface Science | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS-MoM1 Maximizing and Automating Information Extraction in Time-of-Flight Secondary Ion Mass Spectrometry S.J. Pachuta, 3M Company |
| 8:40am | AS-MoM2 G-SIMS - Molecular Structure I.S. Gilmore, M.P. Seah, National Physical Laboratory, UK |
| 9:00am | AS-MoM3 Invited Paper Recent Advances in Time-of-Flight SIMS E. Niehuis, ION-TOF GmbH, Germany |
| 9:40am | AS-MoM5 Invited Paper Applications of Time-of-Flight Secondary Ion Mass Spectrometry in Materials Research B.W. Schueler, Physical Electronics |
| 10:20am | AS-MoM7 Method to Quantify the Comparison of Predicted vs. Experimental Isotopic Clusters in Time of Flight Secondary Ion Mass Spectrometry for High Mass Peak Identification R.W. Nowak, C.M. Mahoney, State University of New York at Buffalo, A. Hawkridge, University of Arizona at Tucson, J.A. Gardella, State University of New York at Buffalo |
| 10:40am | AS-MoM8 TOF-SIMS Characterization of Mixed Decanethiol - Octadecanethiol Self-Assembled Monolayers D.J. Graham, D.G. Castner, University of Washington |
| 11:00am | AS-MoM9 Secondary Ion Emission from Thick Organic Films: Influence of Primary Ion Bombardment Conditions E. Tallarek, Tascon GmbH, Germany, F. Kollmer, ION-TOF GmbH, Germany, B. Hagenhoff, R. Kersting, Tascon GmbH, Germany |
| 11:20am | AS-MoM10 A New Approach to Measuring the TRUE Boron Profile Near the Si Surface using SIMS T.H. Büyüklimanli, J.W. Marino, C.W. Magee, Evans East |
| 11:40am | AS-MoM11 Study of Electron Beam Excited Plasma SNMS for High Detection Sensitivity T. Noguchi, The Graduate University for Advanced Studies, Japan, S. Kato, KEK & The Graduate University for Advanced Studies, Japan |