AVS 49th International Symposium
    Magnetic Interfaces and Nanostructures Thursday Sessions
       Session MI+SS-ThM

Paper MI+SS-ThM6
In-plane Vector Magnetometry on Rectangular Co Dots using Polarized Neutron Reflectivity

Thursday, November 7, 2002, 10:00 am, Room C-205

Session: Magnetic Spectroscopies
Presenter: K. Temst, K.U. Leuven, Belgium
Authors: K. Temst, K.U. Leuven, Belgium
M.J. Van Bael, K.U. Leuven, Belgium
J. Swerts, K.U. Leuven, Belgium
D. Buntinx, K.U. Leuven, Belgium
C. Van Haesendonck, K.U. Leuven, Belgium
Y. Bruynseraede, K.U. Leuven, Belgium
H. Fritzsche, Hahn-Meitner-Institut Berlin, Germany
R. Jonckheere, IMEC vzw, Belgium
Correspondent: Click to Email
We have measured the off-specular polarized neutron reflectivity of a periodic array of rectangular magnetic polycrystalline Co-dots, which were prepared by a combination of electron beam lithography and molecular beam deposition. The dots have a strong shape anisotropy, imposed by a length-to-width ratio of 4:1. The intensity of the off-specular satellite reflection was monitored as function of the magnetic field parallel to the rows of dots and in the plane of the film, allowing us to analyze the magnetization reversal process using the four spin-polarized cross-sections. Analysis of the neutron reflectivity provides in-plane vector magnetometry during magnetization reversal. The neutron reflectivity data are complemented by micromagnetic simulations.