| IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11) | |
| Organic Films and Devices | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | OF+EL+TF-ThA1 Interface Formation in Organic Thin Film Transistors: A Photoemission Spectroscopy Study N.J. Watkins, L. Yan, Y. Gao, University of Rochester |
| 2:20pm | OF+EL+TF-ThA2 Controlling Metallic Contacts to Self-Assembled Monolayers and Molecular Electronic Devices A.V. Walker, B.C. Haynie, T. Tighe, D.L. Allara, N. Winograd, Pennsylvania State University |
| 2:40pm | OF+EL+TF-ThA3 Invited Paper Dependence of Electrical Properties of Metal/Organic/Metal Systems on Interface Electronic Structure, Morphology and Chemistry C. Shen, A. Kahn, Princeton University |
| 3:20pm | OF+EL+TF-ThA5 Organic Modified Schottky Contacts: Barrier Height Engineering and Chemical Stability D.R.T. Zahn, T.U. Kampen, S. Park, TU Chemnitz, Germany, A. Bushell, University of Wales Aberystwyth, M. Rus, TU Chemnitz, Germany |
| 3:40pm | OF+EL+TF-ThA6 Characterization of Organic/organic' Heterojunctions using UV and X-ray Photoemission Spectroscopies and Luminescence Quenching D. Alloway, University of Arizona, D. Schlettwein, University of Bremen and University of Oldenburg, Germany, N.R. Armstrong, University of Arizona |
| 4:00pm | OF+EL+TF-ThA7 The Influence of Substrate Interactions on the Metallicity of Polyaniline Films* B. Xu, University of Nebraska, Lincoln, J. Choi, Louisiana State University, P.A. Dowben, University of Nebraska-Lincoln |
| 4:20pm | OF+EL+TF-ThA8 The Electronic Structure Studies of Fluoride Layer Insertion between Al and Organic EL Material@footnote 1@ Y. Park, J. Lee, Korea Research Institute of Standards and Science, D.Y. Kim, Hallym University, Korea, S.K. Lee, Chonnam University, Korea |
| 4:40pm | OF+EL+TF-ThA9 Direct Observation of Fermi Level Pinning at LUMO in Alkali Metal Doped Organic Films L. Yan, N.J. Watkins, University of Rochester, C.W. Tang, Eastman Kodak Company, Y. Gao, University of Rochester |