IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11)
    Organic Films and Devices Thursday Sessions
       Session OF+EL+TF-ThA

Paper OF+EL+TF-ThA2
Controlling Metallic Contacts to Self-Assembled Monolayers and Molecular Electronic Devices

Thursday, November 1, 2001, 2:20 pm, Room 131

Session: Electronic Properties of Organic Thin Films
Presenter: A.V. Walker, Pennsylvania State University
Authors: A.V. Walker, Pennsylvania State University
B.C. Haynie, Pennsylvania State University
T. Tighe, Pennsylvania State University
D.L. Allara, Pennsylvania State University
N. Winograd, Pennsylvania State University
Correspondent: Click to Email
An understanding of the nature of the metal – atom organic monolayer interaction is vital in the development and design of molecular electronic devices. To fully characterize these interactions, we employ a multi technique approach using time-of-flight secondary ion mass spectrometry (ToF SIMS), infrared spectroscopy (IRS), x-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). Using a methoxy terminated alkanethiol monolayer on Au{111}, we demonstrate that the metal organic monolayer contact can be varied from complete destruction of the monolayer to contact formation at the terminal group to complete penetration through the layer. For metals of intermediate reactivity, e.g. Cu, we observe that the metal atoms interact with the terminal group and penetrate through the layer to the monolayer / Au{111} interface. We have also studied the interaction between promising molecular wire and electronic and device candidates and metal atoms. By using a variety of metals, the formation of the metal molecule contact can also be controlled. This leads us to suggest new metallic contact materials for molecular electronic devices.