AVS 47th International Symposium
    Surface Science Tuesday Sessions

Session SS3+MC-TuM
Technique Innovations: Experiment, Theory and Simulation

Tuesday, October 3, 2000, 8:20 am, Room 210
Moderator: S.B. Sinnott, The University of Kentucky


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:20am SS3+MC-TuM1 Invited Paper
Twenty-First Century Modeling: Multiscale Coupling and its Impact on Surface and Interface Science
E.A. Carter, University of California, Los Angeles
9:00am SS3+MC-TuM3
The KMLYP Density Functional Approximation: A New Method for Accurate Prediction of Activation Barriers and Enthalpies of Reaction
J.K. Kang, C.B. Musgrave, Stanford University
9:20am SS3+MC-TuM4
Probing Chemical Interactions at the Single Bond Level
M.K. Weldon, Bell Laboratories, Lucent Technologies, J.D. Batteas, City University of New York, College of Staten Island, K. Raghavachari, Bell Laboratories, Lucent Technologies
9:40am SS3+MC-TuM5
Surface Vibrational Spectroscopy Beyond the Harmonic Approximation, Experiments and Calculations
P. Uvdal, M.P. Andersson, R. Asmundsson, Lund University, Sweden, A.D. MacKerell, Jr., University of Maryland
10:00am SS3+MC-TuM6
Time Resolved Fourier Transform Infrared Spectroscopy
M. Kovar, P.R. Norton, University of Western Ontario, Canada
10:20am SS3+MC-TuM7
Momentum Space Line Narrowing by Angle Resolved Auger-photoelectron Coincidence Spectroscopy
A. Danese, R.A. Bartynski, Rutgers University, R. Gotter, Lab. Nazionale TASC-INFM, Trieste, Italy, S. Iacobucci, CNR-IMAI Montelibretti, Italy, G. Stefani, U. di Roma III, Italy
10:40am SS3+MC-TuM8
A Microarray Technique for Measuring Adsorption/Desorption Kinetics
M.C. Wheeler, R.E. Cavicchi, G.E. Poirier, S. Semancik, National Institute of Standards and Technology
11:00am SS3+MC-TuM9
Scanning Probe Energy Loss Spectroscopy: Spectroscopic Analysis of Reflected Electrons in Field Emission STM
B.J. Eves, F. Festy, K. Svensson, R.E. Palmer, University of Birmingham, UK
11:20am SS3+MC-TuM10
Application of a Direct Method in Surface X-ray Crystallography
P.F. Lyman, R. Harder, D.K. Saldin, University of Wisconsin, Milwaukee, C.-Y. Kim, K.W. Evans-Lutterodt, Lucent Technologies
11:40am SS3+MC-TuM11
Line of Sight Techniques: Providing an Inventory of all Species Arriving at and Departing from a Surface
R.G. Jones, A.S.Y. Chan, M.P. Skegg, University of Nottingham, UK