AVS 47th International Symposium
    Surface Science Tuesday Sessions
       Session SS3+MC-TuM

Paper SS3+MC-TuM6
Time Resolved Fourier Transform Infrared Spectroscopy

Tuesday, October 3, 2000, 10:00 am, Room 210

Session: Technique Innovations: Experiment, Theory and Simulation
Presenter: M. Kovar, University of Western Ontario, Canada
Authors: M. Kovar, University of Western Ontario, Canada
P.R. Norton, University of Western Ontario, Canada
Correspondent: Click to Email
We have developed a data acquisition system based on digital signal processing for a broadband time-resolved Fourier Transform Infrared Spectrometer. In FTIRS, broadband infrared radiation is modulated by means of a Michelson interferometer. The position of the moving mirror is tracked by the fringe pattern of a reference He/Ne laser, whose beam follows the same optical path as the infrared radiation. Pulses used for time resolution as fast as 500 ns are modulated on a reference He/Ne laser signal. We have chosen a slower mirror speed which permits observation of an external perturbation of a system under investigation which often limits the mirror speed. Different external perturbations can be used, such as thermal, mechanical, photochemical or those caused by external potential. We discuss characteristics of time resolved FTIRS and its performance. The system will permit grazing incidence IR reflection-absorption measurements of surface and thin film processes with sub-microsecond time resolution.