AVS 47th International Symposium
    Organic Films and Devices Wednesday Sessions
       Session OF-WeP

Paper OF-WeP11
Analysis of the Surface Morphology of the Initial Growth Layers of p-quaterphenyl on NaCl (001)

Wednesday, October 4, 2000, 11:00 am, Room Exhibit Hall C & D

Session: Poster Session
Presenter: E.J. Kintzel, Jr., Florida State University
Authors: E.J. Kintzel, Jr., Florida State University
E.A. Akhadov, Florida State University
T.W. Trelenberg, Florida State University
J.G. Skofronick, Florida State University
S.A. Safron, Florida State University
D.H. Van Winkle, Florida State University
F. Flaherty, Valdosta State University
D.-M. Smilgies, European Synchrotron Radiation Facility
Correspondent: Click to Email
We have investigated the structural properties of the initial growth layers of p-quaterphenyl (p-4P) vapor deposited on NaCl (001) using Atomic Force Microscopy (AFM), Helium Atom Scattering (HAS), and X-Ray Grazing Incidence Diffraction (GID). The series of AFM studies provides evidence of needle-like accumulations of p-4P nucleating around surface defects, a striped-phase region with a lateral spacing of approximately 25 nm, and a region which displays a transition from lying to standing orientation of the molecules. HAS investigations at ~50K for films grown at 200K reveal many diffraction peaks which do not appear at the higher temperature. The helium diffraction pattern suggests the formation of randomly oriented micro-crystallites. Our GID studies indicate self-assembly of oriented crystallites in thin films. In thicker samples the diffraction becomes isotropic, like a powder pattern, indicating a random distribution of crystallite orientations.