AVS 47th International Symposium
    Magnetic Interfaces and Nanostructures Wednesday Sessions
       Session MI+EL-WeA

Paper MI+EL-WeA4
Investigation of the Microstructural Dependence of Magnetic Properties for MnSb/Bi Multilayers Grown on Sapphire

Wednesday, October 4, 2000, 3:00 pm, Room 206

Session: Magnetic Semiconductors and Hybrid Structures II
Presenter: M.L. Reed, North Carolina State University
Authors: M.L. Reed, North Carolina State University
H.H. Stadelmaier, North Carolina State University
N.A. El-Masry, North Carolina State University
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The microstructural dependence of the magnetic properties for MnSb/Bi multilayer films grown on sapphire substrates by pulsed laser deposition were investigated by X-ray diffraction(XRD), vibrating sample magnetometer (VSM), and magnetoresistance measurements. Typical hysteresis loops for the MnSb/Bi multilayers are characteristic of ferromagnetic materials. However, altering the growth parameters produces a second coercive field indicating the formation of a second magnetic phase. XRD analysis identified the presence of a peak centered between (0002)MnSb and (0002) MnSb, which in previous samples had not been observed. A change in the relative planar Hall resistance from 1% to 16% with applied magnetic field was also observed in the films that exhibit this second phase. We discuss the nature of this phase and its effect on the magnetic properties of MnSb/Bi.