| AVS 47th International Symposium | |
| Material Characterization | Tuesday Sessions |
| Session MC-TuM |
| Session: | Real World Surface Analysis |
| Presenter: | S. Ohno, University of Washington |
| Authors: | S. Ohno, University of Washington M.-H. Lee, University of Washington K.Y. Lin, University of Washington F.S. Ohuchi, University of Washington |
| Correspondent: | Click to Email |