AVS 46th International Symposium
    Plasma Science and Technology Division Thursday Sessions

Session PS-ThM
Plasma-Surface Interactions II

Thursday, October 28, 1999, 8:20 am, Room 609
Moderator: S. Han, UC Berkeley


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:20am PS-ThM1
Theoretical Analysis of the Interactions of Chemically Reactive Clusters from Silane Plasmas with Crystalline and Amorphous Silicon Surfaces
S. Ramalingam, E.S. Aydil, D. Maroudas, University of California, Santa Barbara, W.M.M. Kessels, Eindhoven University of Technology, The Netherlands
8:40am PS-ThM2
Hydrogen Atom Reactions in a-SiC:H Film Growth
M.-S. Lee, S.F. Bent, Stanford University
9:00am PS-ThM3
An In Situ Study of Plasma Deposition of Hydrogenated Amorphous Silicon Using Multiple Total Internal Reflection Infrared Spectroscopy
D.C. Marra, University of California, Santa Barbara, W.M.M. Kessels, Eindhoven University of Technology, The Netherlands, B.F. Hanyaloglu, E.S. Aydil, University of California, Santa Barbara
9:20am PS-ThM4
Plasma and Surface Chemistry in a Remote Silane Plasma Studied By Various Diagnostics and Related to a-Si:H Film Quality
W.M.M. Kessels, M.C.M. van de Sanden, A.H.M. Smets, B.A. Korevaar, D.C. Schram, Eindhoven University of Technology, The Netherlands
9:40am PS-ThM5
Competition Between Etching and Deposition in Methane/Hydrogen Plasma Interactions with the Si(100) Surface
H.L. Duan, S.F. Bent, Stanford University
10:00am PS-ThM6
A Multi-dimensional Model for an Inductively Coupled Ar/C@sub 4@F@sub 8@ Discharge
S. Rauf, P.L.G. Ventzek, V. Arunachalam, D.G. Coronell, Motorola Inc.
10:20am PS-ThM7
Inorganic Plasma Low-k Materials - Aurora 2.7 -
N. Matsuki, Y. Morisada, Y. Naito, A. Matsunoshita, ASM Japan K.K.
10:40am PS-ThM8
Plasma Modification of Polymeric Membranes
M.L. Steen, E.R. Fisher, N.E. Capps, E.D. Havey, Colorado State University
11:00am PS-ThM9
Polymer Surfaces Modified Using RF Plasma
D.A. Steele, R.D. Short, University of Sheffield, UK, D. Barton, J.W. Bradley, UMIST, UK