| AVS 46th International Symposium | |
| Nanometer-scale Science and Technology Division | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| NS-WeP1 Tip Passive Chemical Modification and Its Effects on Tribological Measurements X.D. Xiao, L.M. Qian, The Hong Kong University of Sci. & Tech., China |
| NS-WeP2 Velocity Dependent Friction J.A. Heimberg, K.J. Wahl, I.L. Singer, Naval Research Laboratory, A. Erdemir, G. Fenske, Argonne National Laboratory |
| NS-WeP3 Gold Nano-wire Fabrication on Si(111) Using Piezoresistive Cantilevers T. Uchihashi, U. Ramsperger, H. Nejoh, National Research Institute for Metals, Japan |
| NS-WeP4 Dual-Wavelength Scanning Near-Field Optical Microscopy P.R. LeBlanc, M. Gu, P. Grutter, McGill University, Canada, D. Gray, PAPRICAN, Canada |
| NS-WeP5 Influence of Secondary Tip Shape and Imaging Mode on Illumination Mode NSOM Images S.J. Stranick, C.E. Jordan, G.W. Bryant, R.R. Cavanagh, L.J. Richter, National Institute of Standards and Technology |
| NS-WeP6 InGaAs Quantum Dots fabricated by Separated-Phase Enhanced Epitaxy with Droplets (SPEED) T. Mano, K. Watanabe, S. Tsukamoto, Y. Imanaka, T. Takamasu, National Research Institute for Metals, Japan, H. Fujioka, University of Tokyo, Japan, G. Kido, National Research Institute for Metals, Japan, M. Oshima, University of Tokyo, Japan, N. Koguchi, National Research Institute for Metals, Japan |
| NS-WeP7 Diamond Growth from a Reconstructed Diamond(100) Monohydride in a Non-uniform Electric Field J.K. Kang, Stanford University |
| NS-WeP8 Fabrication of a Nanosize Metal Aperture for NSOM Sensor using PR Removal and Sputtering Techniques M.Y. Jung, I.W. Lyo, Yonsei University, Korea, S.S. Choi, Sun-Moon University, Korea |
| NS-WeP9 Non-destructive 1-D SCM Dopant Profiling Determination Method and Its Application to the 3-D Dopant Profiling E.-S. Kang, J.-W. Kang, H.-J. Hwang, Chung-Ang University, Korea |