AVS 46th International Symposium | |
Magnetic Interfaces and Nanostructures Technical Group | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
8:20am | MI+VM+AS-TuM1 Perpendicular Patterned Media: Fabrication and Demonstration of Data Storage J. Wong, A. Scherer, California Institute of Technology, M. Todorovic, S. Schultz, University of California, San Diego |
8:40am | MI+VM+AS-TuM2 Ion Beam Patterning of Magnetic Recording Media With a Stencil Mask B.D. Terris, L. Folks, D. Weller, J.E.E. Baglin, A.J. Kellock, IBM Almaden Research Center, H. Rothuizen, P. Vettiger, IBM Zurich Research Lab |
9:00am | MI+VM+AS-TuM3 Ion Induced Magnetization Reorientation in Co/Pt Multilayers for Patterned Media D. Weller, J.E.E. Baglin, K.A. Hannibal, M.F. Toney, L. Folks, A.J. Kellock, M.E. Best, B.D. Terris, IBM Almaden Research Center |
9:20am | MI+VM+AS-TuM4 Texture and Strain in Cr/NiAl Films Grown on Glass Substrates G. Khanna, B.M. Clemens, Stanford University |
9:40am | MI+VM+AS-TuM5 Invited Paper Ultrafast Magnetization Dynamics in Magnetic Thin Films T.M. Crawford, Seagate Research |
10:20am | MI+VM+AS-TuM7 Temperature Dependent Characterization of Thermal Stability of Longitudinal Magnetic Recording Media A. Moser, D. Weller, E. Fullerton, K. Takano, IBM Almaden Research Center |
10:40am | MI+VM+AS-TuM8 High Resolution FE-Auger Electron Spectroscopy: Applications in Magnetic Recording, Heads and Media C.A. Fenno, Seagate Technology - Colorado Design Center |
11:00am | MI+VM+AS-TuM9 Characterization of Co/CN@sub x@ Granular Media Prepared by Nanolamination C. Ruby, J. Du, R. Zhou, S.C. Street, J. Barnard, The University of Alabama |
11:20am | MI+VM+AS-TuM10 Characterization of Hard Disk Drives by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) B. Hagenhoff, R. Kersting, TASCON GmbH, Germany, D. Rading, S. Kayser, E. Niehuis, ION-TOF GmbH, Germany |