| AVS 46th International Symposium | |
| Applied Surface Science Division | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:40pm | AS1-MoA3 Invited Paper Interpretation of Static SIMS Spectra D. Briggs, Siacon Consultants Ltd., U.K. |
| 3:20pm | AS1-MoA5 Characterization of Polymer Additives by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) R. Kersting, TASCON GmbH, Germany, R. Verlaek, DSM Research, The Netherlands, B. Hagenhoff, TASCON GmbH, Germany, A.P. Pijpers, DSM Research, The Netherlands, B.C. Schwede, ION-TOF GmbH, Germany |
| 3:40pm | AS1-MoA6 Secondary Ion Emission from LB-Layers Under Molecular Primary Ion Bombardment D. Stapel, M. Thiemann, Universität Münster, Germany, B. Hagenhoff, TASCON GmbH, Germany, A. Benninghoven, Universität Münster, Germany |
| 4:00pm | AS1-MoA7 Enriched Spectral-information from TOF-SIMS Spectra of Self Assembled Monolayers: More Than Just Molecular Ions D.J. Graham, B.D. Ratner, University of Washington |
| 4:20pm | AS1-MoA8 Static SIMS with Polyatomic Primary Ions A. Benninghoven, D. Stapel, O. Brox, B. Burkhardt, H.F. Arlinghaus, C. Crone, M. Thiemann, Universität Münster, Germany |
| 4:40pm | AS1-MoA9 Quantitative ToF-SIMS and XPS Studies of Surface Structures in Alkyl Side-Chain Polyetherurethanes S.C. Porter, D.G. Castner, B.D. Ratner, University of Washington |
| 5:00pm | AS1-MoA10 Molecular Secondary Neutral Emission from Molecular Overlayers under SF@sub 5@@super +@-Bombardment A. Schnieders, M. Schröder, D. Stapel, H.F. Arlinghaus, A. Benninghoven, Universität Münster, Germany |