Static SIMS has rapidly developed into a powerful tool for the molecular characterisation of surfaces, with modern time-of-flight (ToF) instruments capable of providing both high mass resolution (m/@DELTA@m >7000)and high spatial resolution ( ~ 0.1 micron). Although most of the emphasis to date has been in the application to organic/polymeric systems the technique has equal potential for the surface characterisation of inorganic materials. However, the information content of ToFSIMS spectra is enormous and the interpretation of 'unknown' spectra consequently poses a serious challenge. There is a widespread feeling that the full exploitation of the technique is limited by interpretation problems, particularly with the pressure to deskill/automate all analytical operations. Compared with other forms of mass spectrometry and especially EI-MS, SIMS presents extra problems for spectral interpretation: the physical basis of the ion formation process is very poorly understood, the spectra are influenced by the primary ion used and by the matrix from which the ions originate and there are no established 'rules' for fragmentation. The development of searchable databases of standard spectra has been a key feature of other molecular spectroscopies and this approach clearly represents a way forward for SIMS. Aspects of the development of the only stand-alone database@footnote 1@ will be discussed in the light of these issues. @FootnoteText@ @Footnote 1@The Static SIMS Library, SurfaceSpectra Ltd, Manchester, UK