| AVS 46th International Symposium | |
| Applied Surface Science Division | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 9:00am | AS-ThM3 Invited Paper The Real World: Surface Analysis Applications and Innovations in Industry S.J. Pachuta, 3M |
| 9:40am | AS-ThM5 Effect of Sputtering Gas on Cleaning Al-Based Intermetallics and the Determination of Surface Compositions based on Auger Analysis C.J. Jenks, T.E. Bloomer, M.J. Kramer, Ames Laboratory, J.W. Burnett, Iowa State University, D.W. Delaney, T.A. Lograsso, M.F. Besser, D.J. Sordelet, P.A. Thiel, Ames Laboratory |
| 10:00am | AS-ThM6 Failure Mechanisms of Adhesively Bonded Hot Dipped Galvanised Steel Studied by Small Area XPS R.G. White, VG Scientific, UK, M.F. Fitzpatrick, J.F. Watts, University of Surrey, UK |
| 10:20am | AS-ThM7 Novel X-ray Sensor Suite for In Situ Optimization of Thin Film Architectures L.L. Fehrenbacher, D. Palaith, C. Deaton, J. Ullrich, Technology Assessment & Transfer, Inc. |
| 10:40am | AS-ThM8 A 300mm SAM, with EDX and FIB for Full Wafer Defect and Thin Film Characterization Y. Uritsky, C.R. Brundle, Applied Materials, Inc. |
| 11:00am | AS-ThM9 A Study of the Surface Chemistry and Physical Properties Related to Adhesion of the Polyimide Passivation Layer by XPS, FTIR, and Contact Angle Measurements T. Jiang, C.A, Bradbury, Micron Technology Inc., M. Canavan, Micron Technology Inc |
| 11:20am | AS-ThM10 Diffusion of Large Molecules on Metallic Surfaces using TOFSIMS R. Avci, S.E. Maccagnano, Montana State University, G.L. Gresham, G.S. Groenewold, Idaho National Engineering and Environmental Laboratory |
| 11:40am | AS-ThM11 Identification of Surface Chemical Functional Groups in Reverse Osmosis Membranes: An X-ray Photoelectron Spectroscopy Study S.D. Beverly, S. Seal, S.K. Hong, University of Central Florida |