| AVS 46th International Symposium | |
| Thin Films Division | Tuesday Sessions |
| Session TF-TuA |
| Session: | Fundamentals of Si and Dielectric PVD |
| Presenter: | A. Belkind, Stevens Institute of Technology |
| Authors: | A. Belkind, Stevens Institute of Technology J. Cai, Stevens Institute of Technology R. Scholl, Advanced Energy Industries, Inc. |
| Correspondent: | Click to Email |