AVS 46th International Symposium | |
Thin Films Division | Tuesday Sessions |
Session TF-TuA |
Session: | Fundamentals of Si and Dielectric PVD |
Presenter: | A. Belkind, Stevens Institute of Technology |
Authors: | A. Belkind, Stevens Institute of Technology J. Cai, Stevens Institute of Technology R. Scholl, Advanced Energy Industries, Inc. |
Correspondent: | Click to Email |