| AVS 45th International Symposium | |
| Applied Surface Science Division | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 9:00am | AS-ThM3 Invited Paper Resolution Enhancement of XPS Spectra by Maximum Entropy Deconvolution S.J. Splinter, B.C. Research Inc., Canada, N.S. McIntyre, The University of Western Ontario, Canada |
| 9:40am | AS-ThM5 Evaluation of Calculated and Measured Electron Inelastic Mean Free Paths A. Jablonski, Polish Academy of Sciences, C.J. Powell, National Institute of Standards and Technology |
| 10:00am | AS-ThM6 Development of Well Defined Reference Samples for ARXPS Depth Profiling Studies B.J. Tyler, S.J. Hunt, Montana State University |
| 10:20am | AS-ThM7 Trajectory Projection Factor Analysis D.J. Pocker, B.R. York, IBM SSD |
| 10:40am | AS-ThM8 Quantitative High-Resolution Imaging with Sputter-Initiated Resonance Ionization Spectroscopy K.F. Willey, Atom Sciences, Inc., H.F. Arlinghaus, Westfälische Wilhelms-Universität Münster, Germany, T.J. Whitaker, Atom Sciences, Inc. |
| 11:00am | AS-ThM9 Quantitative Detection of Metals in Organic Matrices by Laser-SNMS A. Schnieders, H.F. Arlinghaus, A. Benninghoven, Universität Münster, Germany |