AVS 45th International Symposium
    Thin Films Division Monday Sessions
       Session TF-MoP

Paper TF-MoP12
Microstructure Study of PMN-PT Films Grown on Metal Electrodes by PLD

Monday, November 2, 1998, 5:30 pm, Room Hall A

Session: Thin Films Poster Session
Presenter: J.M. Siqueiros, UNAM, Mexico
Authors: J.M. Siqueiros, UNAM, Mexico
J. Portelles, Universidad de la Habana, Cuba
A. Fundora, Universidad de la Habana, Cuba
S. Aguilera, Universidad de Catolica de Norte, Chile
Correspondent: Click to Email
Thin ferroelectric films obtained by PLD from non-stoichiometric Pb(Mg@sub 1/3@Nb@sub 2/3@)O@sub 3@-PbTiO@sub 3@ (PMN-PT) ceramic targets are studied. The morphology of the resulting films for the 2.7PMN-0.1PT composition obtained in N@sub 2@ and O@sub 2@ atmospheres at room temperature obtained by SEM is reported. It is observed that, for similar deposit conditions, thicker films with columnar structure are produced in the O@sub 2@ atmosphere as compared with those grown on N@sub 2@ where very low crystallinity was detected. The film composition was determined by Auger electron spectroscopy and XPS. TEM measurements of the N@sub 2@ grown films showed scattered nanostructures embedded in a dominion structure in the paraelectric state, since the measurements were performed at room temperature, above the Curie temperature of the ceramic (15 @degree@C). This result seems to imply a diffuse phase transition associated to the film. Regions of high concentration of Niobium were detected by XPS evidencing the presence of pyrochlores, a situation confirmed by XRD. The PMN-PT/electrode interface is analyzed by TEM for samples annealed at different temperatures and the results are correlated with those obtained by XRD and SEM.