AVS 45th International Symposium
    Thin Films Division Monday Sessions
       Session TF-MoA

Paper TF-MoA7
Nanotribology of Single Crystal ZnO Surfaces: Relation of Atomic Level Friction to Macro Tribology of Thin Films

Monday, November 2, 1998, 4:00 pm, Room 310

Session: Mechanical Properties of Thin Films
Presenter: J.J. Nainaparampil, Air Force Research Laboratory
Authors: J.J. Nainaparampil, Air Force Research Laboratory
J.S. Zabinski, Air Force Research Laboratory
S.V. Prasad, Air Force Research Laboratory
Correspondent: Click to Email
Atomic Force Microscopy (AFM) has been applied to the study of surface forces for more than a decade. Relatively recently, Lateral Force Microscopy (LFM) has evolved from AFM as a means to characterize surface forces in relation to friction, adhesion and surface topography. The significance of this approach is that it reveals insights into friction and wear at an atomic level. This work focuses on the nanotribology of single crystal ZnO surfaces after high temperature annealing treatments and in different gases. Annealing causes the formation of surface structures - etch pits on the 1010 surface and roughening or reconstruction on the 0001 surface. The pits and roughened areas provided lateral force contrast that could not be assigned to topography. Adhesion and relative contact stiffness were not significantly different among friction contrasting regions. The chemistry of these regions was analyzed using Scanning Electron Microscopy (SEM) and Scanning Auger Microscopy (SAM). The LFM and chemical analysis of the different single crystal surfaces will be presented. Insights into atomic level friction and wear processes will be related to the macroscopic tribology of ZnO nanocrystalline thin films.