AVS 45th International Symposium | |
Nanometer-scale Science and Technology Division | Monday Sessions |
Session NS+EM+SS-MoA |
Session: | Cross-sectional Scanning Tunneling Microscopy of Semiconductors |
Presenter: | B. Grandidier, Carnegie Mellon University |
Authors: | B. Grandidier, Carnegie Mellon University H. Chen, Carnegie Mellon University R.M. Feenstra, Carnegie Mellon University R.S. Goldman, University of Michigan C. Silfvenius, Royal Institute of Technology, Sweden G. Landgren, Royal Institute of Technology, Sweden |
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