In applied surface science, instruments are now available with 'push-button' tuning of spectrometers and primary beam columns, automated analysis capabilities, and so on. Nevertheless, far from becoming less important to the analytical process, the analyst remains as critical as ever to the success of the whole enterprise. The aim of this presentation is to discuss some 'practical' knowledge, particularly in relation to sample preparation and instrument operation for surface analysis. My own area of practice is dynamic and static SIMS, using quad and time of flight SIMS instruments. However, the general sample preparation requirements for SIMS are equally encountered in AES, XPS etc. The practical methods discussed should hopefully be of interest to all, not just SIMS practitioners. (1) The following types of sample preparation will be addressed: Cryo-preparation of volatile and organic materials: freeze-drying, cryo-microtoming. Cold introduction and cold stages. X-section preparations: fracture methods, microtoming, 'clean' polishing. Mounting of awkward geometry samples: powders, tubes, rods, fibers: woven; strands; loose mats, etc. Solvent cleaning: which solvents to use in the event of contamination, either on samples or on contaminated sample holders. Potential problems for polymers and organic surface treatments. Use of adhesives for sample mounting: forbidden territory? Which products are acceptable and which are not. (2) Certain instrumental parameters will also be addressed: Primary beam probe size effects: flux densities and beam damage. Requirements for charge compensation on insulators. Tricks of the trade. Practical limits. Spectrometer issues: the importance and influence of the energy window of whatever spectrometer (electron or ion) is in use. In summary, the presentation will aim to give you, a fellow analyst, some ideas that may be of use in increasing that part of your knowledge of surface science that is 'practical'.