AVS 45th International Symposium
    Applied Surface Science Division Thursday Sessions
       Session AS-ThA

Invited Paper AS-ThA7
Quantitative ToF-SIMS Analysis of Industrial Polymers

Thursday, November 5, 1998, 4:00 pm, Room 307

Session: SIMS - Depth Profiling and Molecular Surface Analysis
Presenter: A.A. Galuska, Exxon Chemical Co.
Authors: A.A. Galuska, Exxon Chemical Co.
D.W. Abmayr, Exxon Chemical Co.
Correspondent: email address not available
In recent years, ToF-SIMS has been developed as a tool for surface (top 10 Å) and microscopic (= 60 µm) polymer analysis. The technique is most commonly used to qualitatively identify chemical species on polymer surfaces. However, quantitative methods can also be routinely performed on polymer articles. In fact, much of the real power of the technique for industrial polymer analysis is associated with the quantitative information that can be obtained from the ToF-SIMS mass spectra. In this presentation, we will discuss quantitative ToF-SIMS methods for the analysis of comonomers, sequence distributions, MWs, and trace elements in various polymers. Issues associated with microscopic bulk analysis will also be discussed. When possible, quantitative methods will be demonstrated using industrially meaningful analyses.