AVS 45th International Symposium
    Applied Surface Science Division Monday Sessions
       Session AS-MoA

Paper AS-MoA9
Valence Band X-ray Photoelectron Spectroscopic Studies to Distinguish Between Oxidized Aluminum Species

Monday, November 2, 1998, 4:40 pm, Room 307

Session: Oxides and Insulators - Surface Characterization and Applications
Presenter: P.M.A. Sherwood, Kansas State University
Authors: J.A. Rotole, Kansas State University
P.M.A. Sherwood, Kansas State University
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The determination of the detailed chemical nature of oxidized aluminum species is an essential requirement for the study of many important practical aspects of aluminum metal. While thick oxidized films on aluminum metal can be easily characterized by X-ray powder diffraction when the films are crystalline, thin amorphous films are very difficult to characterize. In this paper a study of the valence band X-ray photoelectron spectrum of aluminum oxides, hydroxides and oxyhydroxides is reported using monochromatized aluminum K@alpha@ X-radiation. The valence band spectra obtained are shown to have significant differences for different oxidized aluminum species, and a spectrum that can be well understood by calculations. The calculated spectra are generated by cluster calculations using multiple scattered wave X@alpha@ calculations, together with spectra generated by band structure calculations. This study compliments earlier published studies from this research group using achromatic radiation, and the use of monochromatized X-radiation can be seen to allow a more conclusive distinction between the oxidized aluminum species.