| AVS 64th International Symposium & Exhibition | |
| Scanning Probe Microscopy Focus Topic | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 1:40pm | SP+2D+AS+NS+SS-MoA1 Invited Paper Probing Atomic and Electronic Structures of 2D Electronic Materials and their Heterostructures Chih-Kang Shih, University of Texas at Dallas |
| 2:20pm | SP+2D+AS+NS+SS-MoA3 SP-STM Study of Antiferromagnetic CuMnAs Thin Film Giang Nguyen, Oak Ridge National Laboratory, P. Wadley, R. Campion, K. Edmonds, University of Nottingham, UK, F. Maccherozzi, S. Dhesi, 3Diamond Light Source, UK, T. Jungwirth, University of Nottingham, UK, A.-P. Li, Oak Ridge National Laboratory |
| 2:40pm | SP+2D+AS+NS+SS-MoA4 Probing Spin-Dependent Chemical Potential in Topological Insulator by Spin-Polarized Four-Probe Scanning Tunneling Microscopy Wonhee Ko, S.M. Hus, Oak Ridge National Laboratory, Y.P. Chen, Purdue University, A.-P. Li, Oak Ridge National Laboratory |
| 3:00pm | SP+2D+AS+NS+SS-MoA5 Invited Paper Spin-charge Transport Phenomena on the Atomic Scale Studied by Multi-probe STM Christoph Tegenkamp, Leibniz Universität Hannover, Germany |
| 4:00pm | SP+2D+AS+NS+SS-MoA8 Invited Paper Site-specific Superconducting Atomic Contacts Studied by Scanning Tunneling Microscopy Yukio Hasegawa, The Institute for Solid State Physics, The University of Tokyo, Japan |
| 4:40pm | SP+2D+AS+NS+SS-MoA10 The Difference between Electron and Hole Dopant of Magnetic Element to the Superconductivity in BaFe2As2 Qiang Zou, L. Li, A. Sefat, D.S. Parker, Z. Gai, Oak Ridge National Laboratory |
| 5:00pm | SP+2D+AS+NS+SS-MoA11 Rapid Measurement of I-V Curves in Scanning Probe Microscopy via Bayesian Inference S. Somnath, K. Law, R. Archibald, S.V. Kalinin, S. Jesse, Rama Vasudevan, Oak Ridge National Laboratory |