| AVS 64th International Symposium & Exhibition | |
| Applied Surface Science Division | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | AS+SS-ThA1 Submicron Spot Sampling Resolution in Thermal Desorption Atomic Force Microscopy - Mass Spectrometry Via Rapid Heating Functions S. Somnath, S. Jesse, Gary Van Berkel, S.V. Kalinin, O.S. Ovchinnikova, Oak Ridge National Laboratory |
| 3:00pm | AS+SS-ThA3 Invited Paper Data Analysis in Thin Film Characterization: Learning More With Physical Models Lev Gelb, A.V. Walker, University of Texas at Dallas |
| 4:00pm | AS+SS-ThA6 Invited Paper Advanced Analysis of XPS and ToF-SIMS Data Matthew Linford, S. Chatterjee, B. Singh, Brigham Young University, N. Gallagher, Eigenvector Inc., M.H. Engelhard, EMSL, Pacific Northwest National Laboratory |
| 4:40pm | AS+SS-ThA8 Using the Auger D-Parameter to Identify Polyatomic Molecular Species Sabrina Tardio, P.J. Cumpson, NEXUS, Newcastle University, UK |
| 5:00pm | AS+SS-ThA9 XPS Analysis of Multilayer HfO2 Using Hard and Soft X-rays Jennifer Mann, Physical Electronics, R. Inoue, H. Yamazui, K. Watanabe, ULVAC-PHI, Japan, J. Newman, Physical Electronics |
| 5:20pm | AS+SS-ThA10 Novel Systems Toward Ambient Pressure Photoemission Spectroscopy Lukasz Walczak, PREVAC, Poland |
| 5:40pm | AS+SS-ThA11 Fabrication and Characterization of Heusler-Based Fe-Mn-Ge Epitaxial Films B.D. Clark, N. Naghibolashrafi, S. Gupta, J. Jones, P.R. LeClair, A. Gupta, Gary Mankey, University of Alabama |