AVS 64th International Symposium & Exhibition | |
Applied Surface Science Division | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
8:00am | AS+MI+SS-TuM1 Effective Attenuation Lengths for Different Quantitative Applications of XPS A. Jablonski, Institute of Physical Chemistry, Warsaw, Poland, Cedric Powell, NIST |
8:20am | AS+MI+SS-TuM2 Plumbing the Depths using the XPS Inelastic Background Alexander Shard, S.J. Spencer, National Physical Laboratory, UK |
8:40am | AS+MI+SS-TuM3 Invited Paper Quantitative Organic Depth Profiling and 3D Imaging using Secondary Ion Mass Spectrometry Rasmus Havelund, National Physical Laboratory, UK |
9:20am | AS+MI+SS-TuM5 Coupling Effects on the Intensity and Background of the Cr 3p Photoemission Spectrum around the Cr 2s Threshold Alberto Herrera-Gomez, CINVESTAV-Unidad Queretaro, Mexico, D. Cabrera-German, Universidad de Sonora, F.-S. Aguirre-Tostado, CIMAV-Monterrey, A. Dutoi, University of the Pacific, M.-O. Vazquez-Lepe, Universidad de Guadalajara, P. Pianetta, Stanford University, D. Nordlund, Stanford Synchrotron Radiation Lightsource, O. Cortazar-Martínez, L. Gomez-Muñoz, CINVESTAV-Unidad Queretaro, Mexico, A. Torrea-Ochoa, CINVESTAV-Unidad Queretaro |
9:40am | AS+MI+SS-TuM6 Using Main Peak Intensities for XPS Quantitation: Strengths, Weaknesses, Issues B. Vincent Crist, XPS International LLC, C.R. Brundle, C. R. Brundle and Associates |
11:00am | AS+MI+SS-TuM10 XPS Spin-Orbit Splitting; Multiplet Splitting; Shake-up Losses: Implications for Determining Covalent Interactions and for Quantitative Analysis C. Richard Brundle, C.R Brundle & Associates, P.S. Bagus, University of North Texas |
11:20am | AS+MI+SS-TuM11 The Cu 2p Photoemission Spectra from Mixed Oxidation States Jorge-Alejandro Torres-Ochoa, CINVESTAV-Unidad Queretaro, Mexico, D. Cabrera-German, Universidad de Sonora, Mexico, M. Bravo-Sanchez, Instituto Potosino de Investigación Científica y Tecnológica A.C, Mexico, A. Herrera-Gomez, CINVESTAV-Unidad Queretaro, Mexico |
11:40am | AS+MI+SS-TuM12 Quantifying Valence Band Offsets at Metal\(Hf,Zr)O2 Interfaces for Ferroelectric Devices Michael Brumbach, S. Smith, M.D. Henry, J. Dickerson, D. Robinson Brown, J. Ihlefeld, Sandia National Laboratories |
12:00pm | AS+MI+SS-TuM13 Quantitative Peak-Fitting Analysis of the Photoemission Spectra of Metallic Zinc and Zinc Oxide Films Dagoberto Cabrera-German, Universidad de Sonora, Mexico, G. Molar-Velazquez, G. Gómez-Sosa, CINVESTAV-Unidad Queretaro, Mexico, W. De la Cruz, Universidad Nacional Autónoma de México, A. Herrera-Gomez, CINVESTAV-Unidad Queretaro, Mexico |