AVS 64th International Symposium & Exhibition
    Applied Surface Science Division Monday Sessions

Session AS+BI-MoA
Practical Surface Analysis: Complex, Organic and Bio-systems

Monday, October 30, 2017, 1:40 pm, Room 13
Moderators: Scott Lea, Pacific Northwest National Laboratory, Paulina Rakowska, National Physical Laboratory, UK


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

2:00pm AS+BI-MoA2
Environmental Charge Compensation - Near Ambient Pressure XPS as a Tool for Surface Chemical Analysis of Iinsulators without Charging Effects
Paul Dietrich, A. Thissen, SPECS Surface Nano Analysis GmbH, Germany, S. Bahr, Enviro Analytical Instruments GmbH, Germany
2:20pm AS+BI-MoA3
Does Time Play a Role in Glyoxal and Hydrogen Peroxide Photochemical Aging?
Fei Zhang, X.F. Yu, X. Sui, Pacific Northwest National Laboratory, J.M. Chen, Fudan University, Z.H. Zhu, X.Y. Yu, Pacific Northwest National Laboratory
2:40pm AS+BI-MoA4
Study of Drug Uptake and Action on Metabolic Processes at the Single-Cell Level using the 3D OrbiSIMS
Ian S. Gilmore, M.K. Passarelli, M. Lorenz, National Physical Laboratory, UK, C.F. Newman, P.S. Marshall, A. West, GlaxoSmithKline, UK, P.D. Rakowska, R. Havelund, C.T. Dollery, National Physical Laboratory, UK
3:00pm AS+BI-MoA5
TOF-SIMS Cluster Beam Depth Profiling and 3D Imaging of Oral Drug Delivery Films
Greg Gillen, S. Muramoto, J. Staymates, E. Robinson, NIST
3:20pm AS+BI-MoA6
Characterisation of Bioelectronic Material Surfaces using Surface Spectroscopies
Sarah Coultas, Kratos Analytical Limited, UK, W. Boxford, Kratos Analytical Ltd, UK, C.J. Blomfield, Kratos Analytical Limited, UK, M. Firlak, J. Hardy, Lancaster University, UK
4:00pm AS+BI-MoA8 Invited Paper
High-resolution SIMS Imaging of Subcellular Structures
Mary Kraft, A.N. Yeager, University of Illinois at Urbana-Champaign, P.K. Weber, Lawrence Livermore National Laboratory
4:40pm AS+BI-MoA10
EnviroESCA – Routine Surface Chemical Analysis under Environmental Conditions For Biological Samples
Andreas Thissen, P. Dietrich, SPECS Surface Nano Analysis GmbH, Germany, S. Bahr, Enviro Analytical Instruments GmbH, Germany, M. Kjaervik, W. Unger, Bundesanstalt für Materialforschung und -prüfung (BAM), Germany