AVS 64th International Symposium & Exhibition | |
Advanced Surface Engineering Division | Thursday Sessions |
Session SE+PS+SS-ThM |
Session: | Plasma-assisted Surface Modification and Deposition Processes |
Presenter: | Shailendra Vikram Singh, R&D Semblant Limited |
Authors: | S.V. Singh, R&D Semblant Limited S. Woollard, R&D Semblant Limited G. Aresta, R&D Semblant Limited A.S. Brooks, R&D Semblant Limited G. Hennighan, R&D Semblant Limited |
Correspondent: | Click to Email |
Plasma-produced thin film liquid ingress barrier coatings for electronic devices have several advantages over conventional parylene-based coatings. However, issues connected with plasma processing conditions, electronic device casing designs, and manufacturing technicalities and throughput, independently or in combination, may limit appropriate implementation of such coatings. Hence, it is critical to apply such coatings directly on the printed circuit board assembly (PCBA) of a device to achieve excellent protection against liquid ingress damages. Moreover, an additional coating on the device case can provide extra features and advantage. A PCBA is a complicated substrate in terms of conformality and adhesion requirements. It comprises an ensemble of different surfaces of different shapes and sizes and various materials: metals, polymers, polyester (fiber and resins), graphite, solder residue, etc. The surface energies of these components on boards vary from ~10 mN/m to up-to ~70 mN/m. In this study, we have addressed the surface treatment and etch cleaning requirements for better adhesion of a reworkable conformal plasma coating. The main challenge resides in altering the surface energy consistently across all the surfaces present on a PCBA. Furthermore, in a manufacturing situation the chance of surface contamination due to handling is very high. Especially, in our case, where, the manufacturing speed is >700 standard phone PCBAs/hr/coater batch. Surface chemistry, type and amount of such randomly introduced contaminations cannot be easily predicted. In this regard, we have also studied several hypothetical contamination situations investigating the relationship between etch-clean and surface energy change.