AVS 64th International Symposium & Exhibition | |
2D Materials Focus Topic | Wednesday Sessions |
Session 2D-WeA |
Session: | Properties and Characterization of 2D Materials |
Presenter: | Andrey Krayev, AIST-NT Inc. |
Authors: | A. Krayev, AIST-NT Inc. M. Chaigneau, Horiba Scientific, France V. Zhizhimontov, AIST-NT Inc A.E. Robinson, AIST-NT Inc |
Correspondent: | Click to Email |
Raman spectroscopy has proved to be an indispensable tool for characterization of both carbon-based 2D materials, such as graphene or graphene oxide, and TMDCs, providing information on: number of layers, distribution of defects, type of structure and (in case of TMDCs) excitonic behavior. Despite the wealth of the information Raman spectroscopy can provide about the structure of 2D materials, its spatial resolution is limited to approximately 300-500nm, depending on the wavelength of the excitation laser; in many cases this is insufficient for precise characterization of spatial distribution of the variations of structural and the related electronic and optoelectronic properties. Hyperspectral imaging using tip enhanced optical spectroscopy (TEOS), which includes tip enhanced Raman spectroscopy (TERS) and tip enhanced photoluminescence spectroscopy (TEPL), can dramatically improve the spatial resolution of both Raman and PL optical microscopy, providing this much-needed sensitivity.
TERS characterization of graphene and graphene oxide, both pristine and functionalized, reveals a dramatic increase in Raman response at folds and wrinkles in the flakes, as well as over the patterns imprinted in the flakes using an ultrasharp single crystal diamond probe. Interestingly, the wrinkles in graphene oxide flakes exhibit increased conductivity compared to flat areas of the flake, a rather unexpected discovery; as graphene oxide in its normal state is a dielectric, increased thickness of the material might have been expected to result in worse conductivity.
TERS and TEPL analysis of as-grown WS2 demonstrated significant heterogeneity of the flakes. In an approximately 100nm-wide band adjacent to the flake edges we see both decreased, blue-shifted intensity of the photoluminescence and also increased intensity of the TERS signal; this can be attributed to decreased density of the charge carriers in the vicinity of the edges resulting in increased efficiency of Raman scattering and decreased concentration of trions, which have red-shifted PL relative to regular un-charged exitons.
TERS and correlated surface potential imaging of the WS2 flakes exfoliated to gold revealed significant nanoscale (from tens to low hundreds of nanometer) variations in intensity of the major Raman bands across the flake. A high resolution map of the photoluminescence distribution extracted from the TERS map of the WS2 flake clearly delineates that portion of the flake that is single layer. Correlation of the TERS hyperspectral image Raman band intensity with the distribution of surface potential may be diagnostic of TMDC doping level and of the exact sign of the charge carriers.