AVS 62nd International Symposium & Exhibition


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Materials Characterization in the Semiconductor Industry Focus Topic Sessions

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Start Time Session Code Session Title
Monday 8:20am AP+AS+MC+MI+NS-MoM Atom Probe Tomography of Nanomaterials
Monday 2:20pm 2D+EM+MC+MS+NS-MoA 2D Materials: Devices and Applications
Tuesday 8:00am MC-TuM Characterization of 3D structures
Tuesday 2:20pm 2D+EM+MC+MI+NS+SP+SS+TF-TuA Electronic and Magnetic Properties of 2D Materials
Tuesday 6:30pm MC-TuP Materials Characterization in the Semiconductor Industry Poster Session (All areas)
Wednesday 2:20pm 2D+EM+IS+MC+NS+SP+SS-WeA Dopants and Defects in 2D Materials

AVS 62nd International Symposium & Exhibition