AVS 62nd International Symposium & Exhibition | |
Scanning Probe Microscopy Focus Topic | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
2:20pm | SP+2D+AS+NS+SS-WeA1 Invited Paper Geometric and Electronic Structures of Epitaxially Grown Pnictide 122, 111 and CuxBi2Se3 Samples Young Kuk, Seoul National University, Republic of Korea |
3:00pm | SP+2D+AS+NS+SS-WeA3 Direct Measurement of Conductance from Topological Surface States in Topological Insulators Corentin Durand, X. Zhang, S. Hus, M. McGuire, I. Vlassiouk, A.-P. Li, Oak Ridge National Laboratory |
3:20pm | SP+2D+AS+NS+SS-WeA4 Chiral Edge States of Topological Insulator in 1D Tae-Hwan Kim, Pohang University of Science and Technology, Republic of Korea, S. Cheon, S.-H. Lee, Institute for Basic Science, Republic of Korea, H.W. Yeom, Pohang University of Science and Technology and Institute for Basic Science, Republic of Korea |
4:20pm | SP+2D+AS+NS+SS-WeA7 Electronic Properties of Quasi-one-dimensional Defects in Monolayer h-BN Chuanxu Ma, J. Park, Oak Ridge National Laboratory, L. Liu, G. Gu, The University of Tennessee, A.P. Baddorf, A.-P. Li, Oak Ridge National Laboratory |
4:40pm | SP+2D+AS+NS+SS-WeA8 Real-Space Imaging of the Multiple Scattering in Single Layer Graphene: FT-STM/STS Studies M. Jung, S.-D. Sohn, J. Park, K. Lee, Hyung-Joon Shin, Ulsan Natioanl Institute of Science and Technology, Republic of Korea |
5:00pm | SP+2D+AS+NS+SS-WeA9 Tunability of Single-Atom Electron Spin Relaxation Times and Their Characterization by Pump-Probe STM William Paul, S. Baumann, IBM Research - Almaden, K. Yang, Chinese Academy of Sciences, N. Romming, University of Hamburg, Germany, T. Choi, C.P. Lutz, A. Heinrich, IBM Research - Almaden |
5:20pm | SP+2D+AS+NS+SS-WeA10 Invited Paper Imaging and Spectroscopy of Graphene Heterostructures Brian LeRoy, University of Arizona |
6:00pm | SP+2D+AS+NS+SS-WeA12 Correlated STM and Electron Transport Study of Individual Nanowires down to Atomic Scale Shengyong Qin, University of Science and Technology of China, T.H. Kim, Oak Ridge National Laboratory, Y. Zhang, R. Wu, University of California, Irvine, H.H. Weitering, The University of Tennessee, Knoxville, C.K. Shih, The University of Texas at Austin, A.-P. Li, Oak Ridge National Laboratory |