| AVS 62nd International Symposium & Exhibition | |
| Materials Characterization in the Semiconductor Industry Focus Topic | Tuesday Sessions |
| Session MC-TuP |
| Session: | Materials Characterization in the Semiconductor Industry Poster Session (All areas) |
| Presenter: | Elena Echeverria, University of Nebraska - Lincoln |
| Authors: | E.M. Echeverria, University of Nebraska - Lincoln R. James, University of North Texas F. Pasquale, University of North Texas B. Dong, University of North Texas A. Enders, University of Nebraska - Lincoln A. Kelber, University of North Texas P.A. Dowben, University of Nebraska - Lincoln |
| Correspondent: | Click to Email |