AVS 62nd International Symposium & Exhibition
    Materials Characterization in the Semiconductor Industry Focus Topic Tuesday Sessions
       Session MC-TuM

Invited Paper MC-TuM5
Preparing and Characterizing Nanoscale Topological Insulators

Tuesday, October 20, 2015, 9:20 am, Room 114

Session: Characterization of 3D structures
Presenter: Kenneth Burch, Boston College
Correspondent: Click to Email
Topological Insulators present new opportunities to control and manipulate spin in future nano-devices. A key difficulty has been realizing the rather high mobilities they promise and detecting unambiguous signatures of surface transport at high temperatures. I will discuss our groups efforts to prepare these materials on the nano-scale using mechanical exfoliation on various substrates with the aim of understanding the role of the substrate in their transport properties. In addition I will discuss the various optical probes (Raman and Infrared) we have applied to understand the phonons and their role in limiting the surface transport properties of these materials.