| AVS 61st International Symposium & Exhibition | |
| Thin Film | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | TF+AS-FrM1 Stability of Platinum Silicide Thin Films above 1000°C Robert Fryer, R.W. Meulenberg, G.P. Bernhardt, R.J. Lad, University of Maine |
| 8:40am | TF+AS-FrM2 Bulge Testing for Mechanical Characterization of sp2/sp3 Carbon Thin Films Joseph Rowley, R.C. Davis, R.R. Vanfleet, N. Boyer, Brigham Young University, S. Liddiard, M. Harker, Moxtek, Inc, L. Pei, Brigham Young University |
| 9:00am | TF+AS-FrM3 Time Dependent Dielectric Breakdown Measurements of Porous Organosilicate Glass using Mercury and Solid Metal Probes Dongfei Pei, University of Wisconsin-Madison, M.T. Nichols, Applied Materials, S.W. King, J.M. Clarke, Intel Corporation, Y. Nishi, Stanford University, J.L. Shohet, University of Wisconsin-Madison |
| 9:20am | TF+AS-FrM4 The Equivalent Width as a Figure of Merit for XPS Narrow Scans Matthew Linford, B. Singh, Brigham Young University, J. Terry, Illinois Institute of Technology |
| 9:40am | TF+AS-FrM5 Invited Paper Characterization of Epitaxial Oxides for Electronics, Magnetics, and Photoactivity Tiffany Kaspar, Pacific Northwest National Laboratory |
| 10:40am | TF+AS-FrM8 Low Energy Ion Scattering Data Analysis for Ultra Thin Films using TRBS Thomas Grehl, P. Brüner, ION-TOF GmbH, Germany, B. Detlefs, E. Nolot, H. Grampeix, CEA-LETI, France, E. Steinbauer, P. Bauer, Johannes Kepler University, Austria, H.H. Brongersma, ION-TOF GmbH, Germany |
| 11:00am | TF+AS-FrM9 Polarization-dependent X-ray Absorption Fine Structure Analysis of TES Pentacene Thin Films Beatrix Pollakowski, Physikalisch-Technische Bundesanstalt (PTB), Germany, J. Wade, JS. Kim, Imperial College London, UK, F.A. Castro, National Physical Laboratory (NPL), UK, J. Lubeck, R. Unterumsberger, Physikalisch-Technische Bundesanstalt (PTB), Germany, A. Zoladek-Lemanczyk, National Physical Laboratory, UK, B. Beckhoff, Physikalisch-Technische Bundesanstalt (PTB), Germany |
| 11:20am | TF+AS-FrM10 Surface Induced Phases in Organic Thin Films: Methods of Crystal Structure Solutions Roland Resel, C. Röthel, A. Pichler, Graz University of Technology, Austria, I. Salzmann, Humboldt University, Germany, R.G. DellaValle, O. Rosconi, University Bologna, Italy, T. Dingeman, Delft University of Technology, Netherlands, C. Simbrunner, University Linz, Austria |