| AVS 61st International Symposium & Exhibition | |
| Applied Surface Science | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | AS+BI+MC-WeA1 The Application of XPS to Study Corroded Stainless Steel Surfaces Helen Brannon, S.J. Coultas, J.D.P. Counsell, S.J. Hutton, A.J. Roberts, C.J. Blomfield, Kratos Analytical Limited, UK, J. Morrison, The University of Birmingham, UK |
| 2:40pm | AS+BI+MC-WeA2 Molecular Characterization of Lubricant Degradation Produced in a Tribological Wear Test Using TOF-SIMS and Scanned Microprobe XPS Imaging Gregory Fisher, S.S. Alnabulsi, Physical Electronics Inc., T. Le Monge, Ecole Centrale de Lyon - LTDS, France, J.S. Hammond, Physical Electronics Inc. |
| 3:00pm | AS+BI+MC-WeA3 Invited Paper Surfaces and Interfaces of Real-World Products: What Do We Really Need to Know and What Are The Best Ways to Find Out? Anna Belu, L. LaGoo, W. Theilacker, Medtronic, Inc. |
| 4:20pm | AS+BI+MC-WeA7 Forensic XPS Surface Characterization of Cosmetic Trace Evidence Brian Strohmeier, Thermo Fisher Scientific, R. Blackledge, Independent Consultant |
| 4:40pm | AS+BI+MC-WeA8 Industrial Applications of Surface Analysis William Stickle, M.D. Johnson, G.A. DeHaan, J.A. Burgess, Hewlett Packard |
| 5:00pm | AS+BI+MC-WeA9 Invited Paper Peter Sherwood Mid-Career Award Talk: Chemical Analysis of Cells and Tissues with Imaging ToF-SIMS Lara J. Gamble, B. Bluestein, D. Graham, University of Washington |
| 5:40pm | AS+BI+MC-WeA11 Characterization Strategies for the Detection of Carbon Nanotubes within an Epoxy Matrix Justin Gorham, J. Woodcock, W.A. Osborn, J. Heddleston, K. Scott, National Institute of Standards and Technology (NIST) |
| 6:00pm | AS+BI+MC-WeA12 Measuring Schmutz: Accounting for Adventitious Carbon Contamination in X-ray Absorption Spectra of Carbon-Based Materials Filippo Mangolini, J.B. McClimon, J. Hilbert, R.W. Carpick, University of Pennsylvania |