AVS 60th International Symposium and Exhibition
    In Situ Spectroscopy and Microscopy Focus Topic Thursday Sessions

Session IS+AS+SS-ThM
Ambient Pressure XPS from Sophistication to Reality

Thursday, October 31, 2013, 8:00 am, Room 203 B
Moderator: A. Thissen, SPECS Surface Nano Analysis GmbH


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:40am IS+AS+SS-ThM3 Invited Paper
Ambient Pressure XPS Observation of Electrode Surfaces during Electrochemical Reactions
H. Sanchez Casalongue, S. Kaya, D.J. Miller, D. Friebel, A. Nilsson, H. Ogasawara, SLAC National Accelerator Laboratory
9:20am IS+AS+SS-ThM5
Ambient Pressure Photoelectron and Electron Spectro-Microscopy Using Electron Transparent Membranes
A. Yulaev, Southern Illinois University Carbondale, M. Amati, L. Gregoratti, Sincrotrone Trieste, Italy, S. Guenther, Technical University Muenchen, Germany, M. Kiskinova, Sincrotrone Trieste, Italy, I. Sgura, B. Bozzini, University of Salento, Italy, A. Kolmakov, Southern Illinois University Carbondale
9:40am IS+AS+SS-ThM6
Surface Chemistry over Inverse Model Catalysts under Near-Ambient Pressure
A. Baber, K. Mudiyenselage, S. Senanayake, J. Rodriguez, D. Stacchiola, Brookhaven National Laboratory
10:40am IS+AS+SS-ThM9 Invited Paper
Ambient Pressure Photoelectron Spectroscopy using Tender X-ray
S. Axnanda, E.J. Crumlin, R. Chang, B. Mao, Lawrence Berkeley National Laboratory, W. Stolte, Lawrence Berkeley National Laboratory, P. Ross, Z. Hussain, Z. Liu, Lawrence Berkeley National Laboratory
11:20am IS+AS+SS-ThM11
Novel Developments in Near Ambient Pressure XPS – The Route Towards Standard Analysis Tools in Laboratory Environments
A. Thissen, S. Bahr, SPECS Surface Nano Analysis GmbH, Germany