AVS 60th International Symposium and Exhibition | |
In Situ Spectroscopy and Microscopy Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
8:40am | IS+AS+SS-ThM3 Invited Paper Ambient Pressure XPS Observation of Electrode Surfaces during Electrochemical Reactions H. Sanchez Casalongue, S. Kaya, D.J. Miller, D. Friebel, A. Nilsson, H. Ogasawara, SLAC National Accelerator Laboratory |
9:20am | IS+AS+SS-ThM5 Ambient Pressure Photoelectron and Electron Spectro-Microscopy Using Electron Transparent Membranes A. Yulaev, Southern Illinois University Carbondale, M. Amati, L. Gregoratti, Sincrotrone Trieste, Italy, S. Guenther, Technical University Muenchen, Germany, M. Kiskinova, Sincrotrone Trieste, Italy, I. Sgura, B. Bozzini, University of Salento, Italy, A. Kolmakov, Southern Illinois University Carbondale |
9:40am | IS+AS+SS-ThM6 Surface Chemistry over Inverse Model Catalysts under Near-Ambient Pressure A. Baber, K. Mudiyenselage, S. Senanayake, J. Rodriguez, D. Stacchiola, Brookhaven National Laboratory |
10:40am | IS+AS+SS-ThM9 Invited Paper Ambient Pressure Photoelectron Spectroscopy using Tender X-ray S. Axnanda, E.J. Crumlin, R. Chang, B. Mao, Lawrence Berkeley National Laboratory, W. Stolte, Lawrence Berkeley National Laboratory, P. Ross, Z. Hussain, Z. Liu, Lawrence Berkeley National Laboratory |
11:20am | IS+AS+SS-ThM11 Novel Developments in Near Ambient Pressure XPS – The Route Towards Standard Analysis Tools in Laboratory Environments A. Thissen, S. Bahr, SPECS Surface Nano Analysis GmbH, Germany |