AVS 60th International Symposium and Exhibition | |
In Situ Spectroscopy and Microscopy Focus Topic | Thursday Sessions |
Session IS+AS+SS-ThM |
Session: | Ambient Pressure XPS from Sophistication to Reality |
Presenter: | S. Bahr, SPECS Surface Nano Analysis GmbH, Germany |
Authors: | A. Thissen, SPECS Surface Nano Analysis GmbH, Germany S. Bahr, SPECS Surface Nano Analysis GmbH, Germany |
Correspondent: | Click to Email |